Woman using microscope in office, reviewing semiconductor substrate structures. Female materials scientists analyzing silicon wafer with optical device in industrial plant RD workspace, camera A
RFID:Image ID:3EWDKPX
Image details
Contributor:
Dragos CondreaImage ID:
3EWDKPXFile size:
53.4 MB (858.1 KB Compressed download)Releases:
Model - no | Property - noDo I need a release?Dimensions:
5760 x 3240 px | 48.8 x 27.4 cm | 19.2 x 10.8 inches | 300dpiDate taken:
29 June 2026Location:
RomaniaMore information:
Woman using microscope in office, reviewing semiconductor substrate structures. Female materials scientists analyzing silicon wafer with optical device in industrial plant RD workspace, camera A