Close-up of a silicon wafer under microscopic inspection. Colorful interference patterns reveal intricate chip structures. Metallic microscope compone Stock Photo

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Close-up of a silicon wafer under microscopic inspection. Colorful interference patterns reveal intricate chip structures. Metallic microscope compone

RFID:3EX1X3W

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Contributor:

Aleksandr Matveev

Image ID:

3EX1X3W

File size:

113.9 MB (2.3 MB Compressed download)

Releases:

Model - no | Property - noDo I need a release?

Dimensions:

7728 x 5152 px | 65.4 x 43.6 cm | 25.8 x 17.2 inches | 300dpi

Date taken:

15 April 2026

More information:

Close-up of a silicon wafer under microscopic inspection. Colorful interference patterns reveal intricate chip structures. Metallic microscope components focus precisely on nanoscale details

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