Interference microscope. Technician using an interference microscope (surface profiler) to examine a microelectromech- anical system (MEMS). The surfa
RMID:Image ID:2ADH31B
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Science Photo LibraryImage ID:
2ADH31BFile size:
40.7 MB (1.5 MB Compressed download)Releases:
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3752 x 3791 px | 31.8 x 32.1 cm | 12.5 x 12.6 inches | 300dpiDate taken:
25 May 2001Photographer:
COLIN CUTHBERT/SCIENCE PHOTO LIBRARYMore information:
Interference microscope. Technician using an interference microscope (surface profiler) to examine a microelectromech- anical system (MEMS). The surface features of the MEMS can be found to a vertical resolution of one tenth of a nanometre using white light interferometry, the pattern caused by the interaction of two waves of white light. MEMS are electrical and mechanical devices with micrometre- sized parts. They include tiny robots (nanorobots), as well as miniature laboratories (labs on a chip) which can be used in sensors or diagnostic devices. Photographed in the Micro- mechanics Lab of Newcastle University, England.
